G. Haehner
Publications by Year
Research Areas
Semiconductor materials and interfaces, Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Molecular Junctions and Nanostructures, Force Microscopy Techniques and Applications
Most-Cited Works
- → A Near Edge X-ray Absorption Fine Structure Spectroscopy and X-ray Photoelectron Spectroscopy Study of the Film Properties of Self-Assembled Monolayers of Organosilanes on Oxidized Si(100)(1995)231 cited
- → Investigation of intermediate steps in the self-assembly of n-alkanethiols on gold surfaces by soft x-ray spectroscopy(1993)156 cited
- → Sensitivity of Frictional Forces to pH on a Nanometer Scale: A Lateral Force Microscopy Study(1995)122 cited
- Reactive ion etch-induced effects on 0.2 micron T-gate $ In sub 0.52 Al sub 0.48 As/In sub 0.53 Ga sub 0.47 As/InP $ HEMTs(1996)