X-ray-absorption edge separation using diffraction anomalous fine structure
Physical review. B, Condensed matter1999Vol. 60(2), pp. 778–785
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Abstract
When two or more absorption edges in a material are sufficiently close in energy, extended-x-ray-absorption-fine-structure spectroscopy is of limited utility as the usable data range above the lower-energy edge is truncated by the higher-energy edge. Energy or wavelength discriminating detection methods may fail to resolve fluorescence lines which are very close in energy. In this paper we present a solution to this problem using the resolution in momentum transfer of diffraction anomalous fine structure (DAFS) to separate the fine- structure signals from elements with closely spaced fluorescence lines. We demonstrate our technique by isolating the titanium edge signal from DAFS measurements of ${\mathrm{BaTiO}}_{3}.$
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