Robust system design with built-in soft-error resilience
Computer2005Vol. 38(2), pp. 43–52
Citations Over TimeTop 1% of 2005 papers
Abstract
Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.
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