K.S. Kim
Intel (United States)(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Low-power high-performance VLSI design, IPv6, Mobility, Handover, Networks, Security
Most-Cited Works
- → Robust system design with built-in soft-error resilience(2005)560 cited
- → X-Compact: An Efficient Response Compaction Technique(2004)218 cited
- → XPAND: an efficient test stimulus compression technique(2006)97 cited
- → XMAX: X-tolerant architecture for MAXimal test compression(2004)40 cited
- → Prefix and Interval-Partitioned Dynamic IP Router-Tables(2005)22 cited
- → Partial scan using reverse direction empirical testability(2002)12 cited
- → Validation and test of network processors and ASICs(2005)1 cited