Development of Alternative Rheological Measurements for DWPF Slurry Samples (U)

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Abstract

Rheological measurements are used to evaluate the fluid dynamic behavior of Defense Waste Processing Facility, DWPF, slurry samples. Measurements are currently made on non-radioactive simulant slurries using two state-of-the-art rheometers located at the Aiken County Technical Laboratory, ACTL. Measurements are made on plant samples using a rheometer in the Savannah River National Laboratory, SRNL, Shielded Cells facility. Low activity simulants or plant samples can be analyzed using a rheometer located in a radioactive hood in SRNL. Variations in the rheology of SB2 simulants impacted the interpretation of results obtained in a number of related studies. A separate rheological study was initiated with the following four goals: (1) Document the variations seen in the simulant slurries, both by a review of recent data, and by a search for similar samples for further study. (2) Attempt to explain the variations in rheological behavior, or, failing that, reduce the number of possible causes. In particular, to empirically check for rheometer-related variations. (3) Exploit the additional capabilities of the rheometers by developing new measurement methods to study the simulant rheological properties in new ways. (4) Formalize the rheological measurement process for DWPF-related samples into a series of protocols. This report focuses on the third and fourth goals. The emphasis of this report is on the development and formalization of rheological measurement methods used to characterize DWPF slurry samples. The organization is by rheological measurement method. Progress on the first two goals was documented in a concurrent technical report, Koopman (2005). That report focused on the types and possible causes of unusual rheological behavior in simulant slurry samples. It was organized by the sample being studied. The experimental portion of this study was performed in the period of March to April 2004. A general rheology protocol for routine DWPF slurry samples, Koopman (2004b), was drafted in addition to the companion technical report to this document.

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