Takashi Aikyo
Semiconductor Energy Laboratory (Japan)(JP)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Engineering and Test Systems, Fault Detection and Control Systems, Advancements in Photolithography Techniques
Most-Cited Works
- → Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects(2006)132 cited
- → A Capture-Safe Test Generation Scheme for At-Speed Scan Testing(2008)32 cited
- → Diagnostic test generation for transition faults using a stuck-at ATPG tool(2009)30 cited
- → Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-Identification(2008)24 cited
- → A Variability-Aware Adaptive Test Flow for Test Quality Improvement(2014)22 cited
- → Small Delay Fault Model for Intra-Gate Resistive Open Defects(2009)16 cited
- → Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines(2007)15 cited
- → Timing-Aware Diagnosis for Small Delay Defects(2007)14 cited
- → A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment(2009)13 cited
- → An Adaptive Test for Parametric Faults Based on Statistical Timing Information(2009)13 cited