K. Taylor
Advanced Micro Devices (United States)(US)
Publications by Year
Research Areas
Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design, Integrated Circuits and Semiconductor Failure Analysis, Metal and Thin Film Mechanics, Copper Interconnects and Reliability
Most-Cited Works
- → Stress modeling of Cu/low-k BEoL - application to stress migration(2004)29 cited
- → Comparative evaluation of gap-fill dielectrics in shallow trench isolation for sub-0.25 μm technologies(2002)19 cited
- → Reliability challenges of high performance PD SOI CMOS with ultra-thin gate dielectrics(2004)18 cited
- → Bias and temperature dependent hot-carrier characteristics of sub-100 nm partially depleted SOI MOSFETs(2003)7 cited
- → New findings of NBTI in partially depleted SOI transistors with ultra-thin gate dielectrics(2004)6 cited
- → Polarity dependent reliability of advanced MOSFET using MOCVD nitrided Hf-silicate high-k gate dielectric(2003)2 cited
- → DC and AC hot-carrier characteristics of partially depleted SOI MOSFETS with ultra-thin gate dielectrics(2004)1 cited