Reliability challenges of high performance PD SOI CMOS with ultra-thin gate dielectrics
Solid-State Electronics2004Vol. 48(10-11), pp. 1703–1708
Citations Over TimeTop 15% of 2004 papers
E. Zhao, John H. Zhang, Akram Salman, Niraj Subba, Jay Chan, Amit Marathe, Stephen G. Beebe, K. Taylor
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