Akram Salman
Thi Qar University(IQ)
Publications by Year
Research Areas
Electrostatic Discharge in Electronics, Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis, Advancements in Semiconductor Devices and Circuit Design, Silicon Carbide Semiconductor Technologies
Most-Cited Works
- → Field Effect Diode (FED): A novel device for ESD protection in deep sub-micron SOI technologies(2006)70 cited
- → SOI Field-Effect Diode DRAM Cell: Design and Operation(2013)56 cited
- → Design and optimization of the SOI field effect diode (FED) for ESD protection(2008)32 cited
- → Design and Characterization of ESD Protection Devices for High-Speed I/O in Advanced SOI Technology(2010)30 cited
- → Overshoot-induced failures in forward-biased diodes: A new challenge to high-speed ESD design(2013)24 cited
- Evaluation of diode-based and NMOS/Lnpn-based ESD protection strategies in a triple gate oxide thickness 0.13 µm CMOS logic technology(2001)
- → ESD-induced oxide breakdown on self-protecting GG-nMOSFET in 0.1-μm CMOS technology(2003)21 cited
- → Reliability challenges of high performance PD SOI CMOS with ultra-thin gate dielectrics(2004)18 cited
- → Engineering optimal high current characteristics of high voltage DENMOS(2012)17 cited
- → Field effect diode for effective CDM ESD protection in 45 nm SOI technology(2009)17 cited