Vincent Goiffon
Université Fédérale de Toulouse Midi-Pyrénées(FR)Institut Superieur de l'Aeronautique et de l'Espace (ISAE-SUPAERO)(FR)National Higher French Institute of Aeronautics and Space(FR)
Publications by Year
Research Areas
CCD and CMOS Imaging Sensors, Infrared Target Detection Methodologies, Advanced Optical Sensing Technologies, Radiation Detection and Scintillator Technologies, Radiation Effects in Electronics
Most-Cited Works
- → Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose(2012)101 cited
- → Displacement Damage Effects Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Submicron Technology(2010)82 cited
- → Multilevel RTS in Proton Irradiated CMOS Image Sensors Manufactured in a Deep Submicron Technology(2009)79 cited
- → Enhanced Radiation-Induced Narrow Channel Effects in Commercial <formula formulatype="inline"><tex Notation="TeX">${\hbox {0.18}}~\mu$</tex> </formula>m Bulk Technology(2011)75 cited
- → Simulation of Single Particle Displacement Damage in Silicon–Part II: Generation and Long-Time Relaxation of Damage Structure(2016)69 cited
- → Total Ionizing Dose Versus Displacement Damage Dose Induced Dark Current Random Telegraph Signals in CMOS Image Sensors