Irith Pomeranz
Purdue University West Lafayette(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Low-power high-performance VLSI design, Engineering and Test Systems
Most-Cited Works
- → Techniques for minimizing power dissipation in scan and combinational circuits during test application(1998)318 cited
- → Transient-fault recovery for chip multiprocessors(2003)307 cited
- → Transient-fault recovery using simultaneous multithreading(2002)261 cited
- → COMPACTEST: A METHOD TO GENERATE COMPACT TEST SETS FOR COMBINATIONAL CIRCUITS(2005)260 cited
- → Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs(2006)236 cited
- → Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits(1995)222 cited
- → On static compaction of test sequences for synchronous sequential circuits(1996)119 cited