Praveen Parvathala
Intel (United States)(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, 3D IC and TSV technologies, Embedded Systems Design Techniques
Most-Cited Works
- → FRITS - a microprocessor functional BIST method(2003)235 cited
- → A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests(2006)32 cited
- → A Functional Fault Model with Implicit Fault Effect Propagation Requirements(2006)4 cited
- Session 5C: Embedded Tutorial - Functional ATPG(2006)
- → High Level Test Generation / SW based Embedded Test(2005)