S.M. Reddy
University of California, San Diego(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Low-power high-performance VLSI design, VLSI and FPGA Design Techniques
Most-Cited Works
- → On Delay Fault Testing in Logic Circuits(1987)558 cited
- → Techniques for minimizing power dissipation in scan and combinational circuits during test application(1998)318 cited
- → Easily Testable Realizations ror Logic Functions(1972)277 cited
- → COMPACTEST: A METHOD TO GENERATE COMPACT TEST SETS FOR COMBINATIONAL CIRCUITS(2005)260 cited
- → Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs(2006)236 cited
- → Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits(1995)222 cited
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