Yoshinobu Higami
Ehime University(JP)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Engineering and Test Systems, Fault Detection and Control Systems
Most-Cited Works
- → Reduced scan shift: a new testing method for sequential circuits(2002)36 cited
- → Diagnostic test generation for transition faults using a stuck-at ATPG tool(2009)30 cited
- → Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation(2016)24 cited
- → Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines(2007)15 cited
- → Timing-Aware Diagnosis for Small Delay Defects(2007)14 cited
- → Fault simulation and test generation for clock delay faults(2011)11 cited
- → Simulation-based diagnosis for crosstalk faults in sequential circuits(2002)10 cited
- → Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults(2008)10 cited
- → A Novel Approach for Improving the Quality of Open Fault Diagnosis(2009)10 cited
- → Residual energy-based OLSR in mobile ad hoc networks(2011)9 cited