Janusz Rajski
Siemens (Germany)(DE)Siemens (United States)(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, VLSI and FPGA Design Techniques, Engineering and Test Systems, Radiation Effects in Electronics
Most-Cited Works
- → Embedded Deterministic Test(2004)520 cited
- → Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers(1995)406 cited
- → Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs(2006)236 cited
- → A method of fault analysis for test generation and fault diagnosis(1988)158 cited
- → High-frequency, at-speed scan testing(2003)155 cited
- → Testing and diagnosis of interconnects using boundary scan architecture(2003)140 cited
- → Convolutional compaction of test responses