A. Amerasekera
Texas Instruments (United States)(US)
Publications by Year
Research Areas
Electrostatic Discharge in Electronics, Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis, Advancements in Semiconductor Devices and Circuit Design, Low-power high-performance VLSI design
Most-Cited Works
- → ESD in Silicon Integrated Circuits(2002)416 cited
- → The impact of technology scaling on ESD robustness and protection circuit design(1995)159 cited
- → Modeling MOS snapback and parasitic bipolar action for circuit-level ESD and high current simulations(1996)147 cited
- → ESD: a pervasive reliability concern for IC technologies(1993)146 cited
- → A 12.5Gb/s SerDes in 65nm CMOS Using a Baud-Rate ADC with Digital Receiver Equalization and Clock Recovery(2007)145 cited
- → Characterization and modeling of second breakdown in NMOST's for the extraction of ESD-related process and design parameters(1991)114 cited
- → Self-heating effects in basic semiconductor structures(1993)98 cited
- → Substrate triggering and salicide effects on ESD performance and protection circuit design in deep submicron CMOS processes(2002)91 cited
- → ESD failure modes: characteristics mechanisms, and process influences(1992)81 cited
- → Substrate pump NMOS for ESD protection applications(2002)80 cited