K.S. Abdel-Hafez
Synopsys (United States)(US)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Engineering and Test Systems, Low-power high-performance VLSI design, Radiation Effects in Electronics
Most-Cited Works
- → Design for Testability(2006)118 cited
- → VirtualScan: a new compressed scan technology for test cost reduction(2005)105 cited
- → A New ATPG Method for Efficient Capture Power Reduction During Scan Testing(2006)91 cited
- → Ultrascan: using time-division demultiplexing/multiplexing (TDDM/TDM) with virtualscan for test cost reduction(2006)21 cited
- → State of the art low capture power methodology(2011)9 cited
- → Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs(2022)7 cited