Chi-Feng Wu
Realtek (Taiwan)(TW)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Embedded Systems Design Techniques, VLSI and FPGA Design Techniques
Most-Cited Works
- → Built-in redundancy analysis for memory yield improvement(2003)192 cited
- → A programmable BIST core for embedded DRAM(1999)124 cited
- → RAMSES: a fast memory fault simulator(2003)89 cited
- → A built-in self-test and self-diagnosis scheme for embedded SRAM(2002)62 cited
- → Flash memory built-in self-test using March-like algorithms(2003)54 cited
- → Simulation-based test algorithm generation for random access memories(2002)49 cited
- → Fault simulation and test algorithm generation for random access memories(2002)42 cited
- → High fan-in dynamic cmos comparators with low transistor count(2003)32 cited
- → A built-in self-test and self-diagnosis scheme for heterogeneous SRAM clusters(2002)25 cited
- → A low-power and high-speed dynamic PLA circuit configuration for single-clock CMOS(1999)22 cited