Laung‐Terng Wang

Publications by Year

Research Areas

VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Engineering and Test Systems, Physical Unclonable Functions (PUFs) and Hardware Security, Radiation Effects in Electronics

Most-Cited Works

• VLSI Test Principles and Architectures: Design for Testability(2006)
• Electronic Design Automation: Synthesis, Verification, and Test(2009)
• → On low-capture-power test generation for scan testing(2005)165 cited
• System-on-Chip Test Architectures: Nanometer Design for Testability(2007)
• → Low-capture-power test generation for scan-based at-speed testing(2006)125 cited
• VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)(2006)
• → Design for Testability(2006)118 cited
• → A New ATPG Method for Efficient Capture Power Reduction During Scan Testing(2006)91 cited
• → A novel scheme to reduce power supply noise for high-quality at-speed scan testing(2007)77 cited
• → Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding(2016)72 cited