Srinivas Patil
Amity University(IN)
Publications by Year
Research Areas
VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis, Radiation Effects in Electronics, Low-power high-performance VLSI design, Advancements in Semiconductor Devices and Circuit Design
Most-Cited Works
- → A Functional Coverage Metric for Estimating the Gate-Level Fault Coverage of Functional Tests(2006)32 cited
- → Parallel test generation for sequential circuits on general-purpose multiprocessors(1991)31 cited
- → A low-cost concurrent error detection technique for processor control logic(2008)27 cited
- → RT-Level Deviation-Based Grading of Functional Test Sequences(2009)27 cited
- → The Region-Exhaustive Fault Model(2007)23 cited
- → FPGA-based hardware acceleration for Boolean satisfiability(2009)22 cited
- → Estimating the Fault Coverage of Functional Test Sequences Without Fault Simulation(2007)20 cited
- → Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip(2011)16 cited
- → Selecting High-Quality Delay Tests for Manufacturing Test and Debug(2006)14 cited
- Parallel algorithms for test generation and fault simulation(1991)